I'm trying to extract labeled surface statistics (primarily thickness) from the CRUISE outputs. I've managed to apply the labeling algorithm (Labeling via Multiple Atlas Registrations) output to a surface using the "Volume Labels to Surface" module. Now I would like to use the "Surface Label Statistics" module to correlate thickness measurements with these labels. However, the input for that module requires a "Surface(s) with Statistic" input that I don't know how to generate.

In previous versions of the JIST/CRUISE package there was a module called "Iso-Levels for Surface" that took as input an iso-level image and a surface file and output an "Iso level surface" that I could use as the "Surface(s) with Statistic" input. However that module seems to have disappeared in current versions of JIST and I can't find an equivalent module.

Hey Min, thanks for the response. We're using the TOADS-CRUISE_2012_Mar_23_R3c jar for JIST. The "Iso-Levels for Surface" module is missing. We do have the Thickness v1.3R module, which works for whole-surface measurements but we would really like to also measure label-specific thickness. 

Do you think it's just a matter of getting the class file for the missing module? If so, where would I find it?

Hi Colin,

Which version of JIST are you using? I still see a "Iso-Levels for Surface" under IACL->Measurement->Surface. There's also a module called "Thickness" in that folder. Is that missing for you too?

~Min